首页> 外国专利> SURFACE CLEANLINESS EVALUATING METHOD AND SURFACE CLEANLINESS EVALUATING DEVICE

SURFACE CLEANLINESS EVALUATING METHOD AND SURFACE CLEANLINESS EVALUATING DEVICE

机译:表面清洁度评估方法和表面清洁度评估装置

摘要

PROBLEM TO BE SOLVED: To provide a surface cleanliness evaluating method and a surface cleanliness evaluating device for easily evaluating surface cleanliness in a short period of time.;SOLUTION: In this surface cleanliness evaluating method, the cleanliness of a specimen surface is evaluated by using an electron probe microanalysis device. According to this method, a reflection electron image of the specimen surface picturized by the microanalysis device is visually checked to pinpoint a position where faint contrast exists and thereafter the number of fine particles existing in the position is counted to evaluate the surface cleanliness. The surface cleanliness evaluating device is equipped with the microanalysis device and used to evaluate surface cleanliness.;COPYRIGHT: (C)2004,JPO
机译:要解决的问题:提供一种表面清洁度评估方法和一种表面清洁度评估装置,以便在短时间内轻松评估表面清洁度。;解决方案:在这种表面清洁度评估方法中,样品表面的清洁度通过使用电子探针微分析装置。根据该方法,目视检查由微分析装置拍摄的样本表面的反射电子图像,以查明存在微弱对比度的位置,然后对存在于该位置的微粒的数量进行计数,以评价表面清洁度。表面清洁度评价装置装有微量分析装置,用于评价表面清洁度。版权所有:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2003329623A

    专利类型

  • 公开/公告日2003-11-19

    原文格式PDF

  • 申请/专利权人 TOSHIBA CERAMICS CO LTD;

    申请/专利号JP20020137213

  • 发明设计人 HAMANO TSUTOMU;

    申请日2002-05-13

  • 分类号G01N23/225;C03B20/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:26:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号