首页> 外国专利> PROBE CARD FOR INSPECTING SHORT CIRCUIT BETWEEN SURFACES OF LIQUID CRYSTAL PANEL AND METHOD FOR ROUGHLY SCREENING LIQUID CRYSTAL PANEL BY INTER-SURFACE SHORT CIRCUIT INSPECTION

PROBE CARD FOR INSPECTING SHORT CIRCUIT BETWEEN SURFACES OF LIQUID CRYSTAL PANEL AND METHOD FOR ROUGHLY SCREENING LIQUID CRYSTAL PANEL BY INTER-SURFACE SHORT CIRCUIT INSPECTION

机译:液晶面板表面间短路检查的探针卡及表面间短路检查对液晶面板进行粗糙筛分的方法

摘要

PPROBLEM TO BE SOLVED: To efficiently select a COG-LCD panel. PSOLUTION: A short circuit between upper and lower glasses is inspected by using a probe card for inspection which has: an electrode pattern for inspection for connecting all segment electrodes of simple constitution together at a time before an LCD driving IC is mounted on the panel; and an electrode pattern for inspection for connecting common electrodes provided at both ends of the segment electrodes together at a time in order to sort non-defective panels from defective panels, thus performing rough screening as to whether the LCD panel is a non-defective article or a defective article. PCOPYRIGHT: (C)2004,JPO
机译:

要解决的问题:要有效地选择COG-LCD面板。

解决方案:使用检查用探针卡检查上下玻璃之间的短路,该探针卡具有:用于检查的电极图案,用于在安装LCD驱动IC之前一次将所有结构简单的分段电极连接在一起面板;以及用于检查的电极图案,该电极图案用于一次将设置在分段电极两端的公共电极连接在一起,以便将有缺陷的面板与有缺陷的面板进行分类,从而对LCD面板是否为无缺陷的物品进行粗略的筛选。或有缺陷的物品。

版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2003337315A

    专利类型

  • 公开/公告日2003-11-28

    原文格式PDF

  • 申请/专利权人 ROHM CO LTD;

    申请/专利号JP20020146769

  • 发明设计人 KODAMA NOBUTOSHI;

    申请日2002-05-21

  • 分类号G02F1/13;G01R1/073;G01R31/02;

  • 国家 JP

  • 入库时间 2022-08-21 23:24:07

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