首页> 外国专利> Work function or ionization potential measurement equipment and its manner

Work function or ionization potential measurement equipment and its manner

机译:功函数或电离势测量设备及其方式

摘要

PROBLEM TO BE SOLVED: To accurately measure the work function or ionization potential of a sample. SOLUTION: The ultraviolet ray from a heavy hydrogen lamp 1 is disided with a spectroscope 2, and poured on a sample 5. The photoelectron that occurred is detected with a photomultiplier 13. Based on such wavelength (energy) with which discharge of photoelectron from the sample 5 starts, a work function or ionization potential is obtained. Here, by fixing of electric potential of a sample with a DC power source 11, adjustment of a position of sample 5 with a goniometer 9, and adjustment of irradiated ultraviolet ray intensity with an ND filter 8, etc., the absorption current of a sample measured with a minute ampere meter is kept constant, so that the sample is prevented from charged up for measurement of accurate work function or ionization potential.
机译:要解决的问题:准确测量样品的功函数或电离势。解决方案:将重氢灯1发出的紫外线用分光镜2散射,然后倒在样品5上。用光电倍增管13探测发生的光电子。样品5开始,获得功函数或电离势。此处,通过用直流电源11固定样品的电位,用测角计9调节样品5的位置,并用ND滤光片8调节照射紫外线的强度等,使样品的吸收电流增加。用分钟安培计测量的样品保持恒定,从而避免了为测量精确的功函数或电离电势而使样品带电。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号