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Substrate crack method of detection and substrate crack detection device null of information record media of disk

机译:磁盘信息记录介质的基板裂纹检测方法及基板裂纹检测装置的失效

摘要

PROBLEM TO BE SOLVED: To detect a crack of a substrate of a disc-like data-recording medium at high speed by shedding light on the crack of the substrate and detecting a reflecting light. ;SOLUTION: A data-recording medium 4 is loaded in such a manner that a center hole 11 is fitted with a projecting part 1a of a spindle 1. An inner peripheral transparent part of the medium 4 is vacuum-chucked. A spindle motor 5 rotates a spindle 1 and the medium 4. A semiconductor laser 2a is driven by a laser-driving source 21 to emit a laser light L to a crack of a substrate at the innermost peripheral part of the medium 4 with an angle of approximately 90°. If a crack 12 is present, the laser light L enters a horizontal plane of the medium 4 with an angle of approximately 40°, is reflected at the crack, and returns to a photodetector 2b. The light is detected there and a detection signal is brought into a crack judgment part 7 through an amplifier 3, whereby the presence of the crack is determined. If the crack 12 does not exist, the laser light L is not returned to the photodetector 2b. It is thus detected that the crack 12 is not present.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:通过将光照射在基板的裂缝上并检测反射光来高速检测盘状数据记录介质的基板的裂缝。 ;解决方案:以这样的方式加载数据记录介质4:中心孔11装有主轴1的突出部分1a。介质4的内周透明部分被真空吸盘。主轴电动机5使主轴1和介质4旋转。半导体激光器2a由激光驱动源21驱动,以一定角度向介质4的最内周部分的基板的裂缝发射激光L。大约90°。如果存在裂缝12,则激光L以大约40°的角度进入介质4的水平面,在裂缝处被反射,然后返回到光电检测器2b。在那里检测到光,并且检测信号通过放大器3进入裂缝判断部分7,从而确定裂缝的存在。如果裂纹12不存在,则激光L不返回到光电检测器2b。因此检测到裂纹12不存在。;版权所有:(C)1997,日本特许厅

著录项

  • 公开/公告号JP3511745B2

    专利类型

  • 公开/公告日2004-03-29

    原文格式PDF

  • 申请/专利权人 ソニー株式会社;

    申请/专利号JP19950207867

  • 发明设计人 畑山 仁志;

    申请日1995-07-21

  • 分类号G01N21/95;G11B7/26;G11B23/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:23:52

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