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Thermal resistance calculation method and a recording medium and a heat resistance computing device of semiconductor package

机译:半导体封装的热阻计算方法以及记录介质和热阻计算装置

摘要

PROBLEM TO BE SOLVED: To easily obtain the thermal resistance of a semiconductor package, by using each thermal resistance of a radiation path passing through the rear surface of a case, a radiation path passing through a lead frame, and a radiation path passing through a side part, the thermal resistance between a semiconductor chip and the surface of the case, and the thermal resistance of a cooling fin single substance. ;SOLUTION: In a semiconductor package, a semiconductor chip 1 being mounted onto an island 8 is molded by resin 3 in a case 7, and a lead frame 2 being extended in all directions from the inside of the case 7 is connected to the semiconductor chip 1 by a bonding wire 9. In this case, the thermal resistance of the semiconductor package with a cooling fin 11 being mounted onto the surface of the case 7 is obtained according to the thermal resistance of a radiation path passing through the rear surface of the case 7, the thermal resistance of a radiation path passing through a lead frame 2, the thermal resistance of a radiation path passing through a side part other than the lead frame, the thermal resistance between the semiconductor chip 1 and the surface of the case 7, and the thermal resistance of the single substance of a cooling fin 11.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:为了容易地获得半导体封装的热阻,通过使用穿过壳体的后表面的辐射路径,穿过引线框架的辐射路径以及穿过引线框架的辐射路径的每个热阻。侧面部分,半导体芯片与壳体表面之间的热阻以及散热片单一物质的热阻。 ;解决方案:在半导体封装中,安装在岛8上的半导体芯片1由树脂7模制在壳体7中,并且从壳体7的内部向各个方向延伸的引线框架2连接到半导体上。通过接合线9将芯片1固定在芯片1上。在这种情况下,根据穿过散热片11的后表面的辐射路径的热阻,获得在其上安装有散热片11的半导体封装的热阻。壳体7,穿过引线框架2的辐射路径的热阻,穿过除引线框架之外的侧部的辐射路径的热阻,半导体芯片1与壳体的表面之间的热阻7,散热片11的单一物质的热阻;版权:(C)1999,JPO

著录项

  • 公开/公告号JP3501644B2

    专利类型

  • 公开/公告日2004-03-02

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP19980021063

  • 发明设计人 北城 栄;三窪 和幸;

    申请日1998-02-02

  • 分类号H01L23/34;

  • 国家 JP

  • 入库时间 2022-08-21 23:23:34

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