首页>
外国专利>
Micro array, micro array production manner and the pin between spot quantitative error amendment manner null in micro
Micro array, micro array production manner and the pin between spot quantitative error amendment manner null in micro
展开▼
机译:微阵列,微阵列的生产方式和斑点之间的针脚定量误差修正方式在微阵列中为零
展开▼
页面导航
摘要
著录项
相似文献
摘要
The present invention has an objective of obtaining more accurate data of microarray experiments by correcting an inter-pin spotting amount error caused upon microarray production using a plurality of pins. Upon microarray production, samples are immobilized on a microarray support using all pins as controls for correcting the inter-pin spotting amount errors. After the microarray experiments, luminescent intensities of the samples used as control spots for correcting the inter-pin spotting amount errors are measured and used to obtain correction parameters for the inter-pin spotting amount errors of respective pins. These parameters are used to correct luminescent intensities of other samples. IMAGE
展开▼