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Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method
Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method
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机译:用于充电损伤评估的半导体器件和充电损伤评估方法
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摘要
A semiconductor device for charge-up damage evaluation and an evaluation method for the same are provided which permit to detect charge-up damage caused by static electricity. There are provided a silicon substrate 9, a first insulation film 10 formed on the silicon substrate 9, a first conductive layer 6 formed on the first insulation film 10 and connected to the silicon substrate 9, a second insulation film 11 formed on the first conductive layer 6, a second conductive layer 8 formed on the second insulation film 11 and serving as an antenna, and a third insulation film 12 formed on the second conductive layer 8. 展开▼