首页> 外国专利> Isolation structures for imposing stress patterns

Isolation structures for imposing stress patterns

机译:施加应力模式的隔离结构

摘要

A substrate under tension and/or compression improves performance of devices fabricated therein. Tension and/or compression can be imposed on a substrate through selection of appropriate STI fill material. The STI regions are formed in the substrate layer and impose forces on adjacent substrate areas. The substrate areas under compression or tension exhibit charge mobility characteristics different from those of a non-stressed substrate. By controllably varying these stresses within NFET and PFET devices formed on a substrate, improvements in IC performance are achieved.
机译:在张力和/或压缩下的基板改善了在其中制造的装置的性能。通过选择合适的STI填充材料,可以在基板上施加张力和/或压缩。 STI区域形成在衬底层中,并在相邻的衬底区域上施加力。在压缩或拉伸下的基板区域表现出与非应力基板不同的电荷迁移率特性。通过可控地改变在衬底上形成的NFET和PFET器件中的这些应力,可以实现IC性能的提高。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号