On-die pattern generator for high speed serial interconnect built-in self test

摘要

An apparatus and method for generating test patterns with an on-die self test circuit (e.g., IBIST) are disclosed. In various embodiments, the IBIST comprises a sub-pattern generator that may include one or more of a storage element for a user-defined sub-pattern, a clock sub-pattern generator, and a constant sub-pattern generator. A multiplexer is used to assemble a test pattern based on a combination of sub-patterns from the sub-pattern generator.