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Method of spectrum analysis in two-dimensional representation

机译:二维表示中的频谱分析方法

摘要

The present invention relates to a method for extracting individual band components from heavily overlapping bands. The method is based on first derivative-second derivative plots of an experimental spectrum and consists of two stases. The first stage is concerned with the geometric approach that estimates a set of values for the parameters of a component band in the overlapping bands, and repeats band decomposition of the remaining bands in the same manner after removing the estimated band from the overlapping bands. The second stage is to minimize the difference between the profiles of the estimated band and its complementary band by a least-squares optimization, and then to determine the optimum values of the band parameters.
机译:本发明涉及一种从高度重叠的频带中提取各个频带分量的方法。该方法基于实验光谱的一阶导数-二阶导数图,并且由两个阶段组成。第一阶段涉及几何方法,该方法估计重叠频带中的分量频带的参数的一组值,并且在从重叠频带中去除估计频带之后,以相同的方式重复其余频带的频带分解。第二阶段是通过最小二乘优化来最小化估计频带及其互补频带的轮廓之间的差异,然后确定频带参数的最佳值。

著录项

  • 公开/公告号US6791075B2

    专利类型

  • 公开/公告日2004-09-14

    原文格式PDF

  • 申请/专利权人 KOASHI KATSUE;

    申请/专利号US20010782440

  • 发明设计人 KATSUE KOASHI;

    申请日2001-02-13

  • 分类号G01J35/00;

  • 国家 US

  • 入库时间 2022-08-21 23:19:27

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