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Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
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机译:使用基于干涉仪的光网络分析同时表征光学组件的两个端口的测试结构
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摘要
A test structure supports simultaneous characterization of a two port optical component. The test structure includes an input port for receiving an input signal from an optical source, two test ports for connecting the test structure to a component under test, separate optical paths for supplying reflected and transmitted optical response signals from the component under test to separate receivers, and optical components for combining a first portion of the input signal with the reflected optical response signal before the first portion of the input signal and the reflected optical response signal are detected by a first receiver and for combining a second portion of the input signal with the optical response signal before the second signal and the optical response signal are detected by a second receiver. The optical component of the test structure may be connected by optical fibers or integrated into a single substrate.
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