首页> 外国专利> Dual-bit floating-gate flash cell structure and its contactless flash memory arrays

Dual-bit floating-gate flash cell structure and its contactless flash memory arrays

机译:双位浮栅闪存单元结构及其非接触式闪存阵列

摘要

A dual-bit floating-gate flash cell structure comprises a gate region being formed between a common-source region and a common-drain region. The gate region comprises a pair of floating-gates being defined by a pair of second sidewall dielectric spacers and a select-gate dielectric layer being formed between the pair of floating-gates. The common-source/drain region comprises a common-source/drain diffusion region or a pair of isolated source/drain diffusion regions being divided by a shallow trench isolation formed between a pair of first sidewall dielectric spacers. A word line being formed over an intergate dielectric layer is at least formed over the pair of floating-gates and the select-gate dielectric layer. Based on common-source/drain diffusion regions and isolated source/drain diffusion regions of the dual-bit floating-gate cell structure, two different contactless flash memory arrays are formed.
机译:双位浮栅闪存单元结构包括在公共源极区和公共漏极区之间形成的栅极区。栅极区域包括由一对第二侧壁电介质间隔物限定的一对浮栅和在该对浮栅之间形成的选择栅电介质层。公共源极/漏极区域包括公共源极/漏极扩散区域或一对隔离的源极/漏极扩散区域,所述一对隔离的源极/漏极扩散区域被形成在一对第一侧壁电介质间隔物之间​​的浅沟槽隔离所划分。至少在一对浮栅和选择栅介电层之上形成在栅间介电层之上形成的字线。基于双位浮栅单元结构的共源/漏扩散区和隔离的源/漏扩散区,形成两个不同的非接触式闪存阵列。

著录项

  • 公开/公告号US6744664B1

    专利类型

  • 公开/公告日2004-06-01

    原文格式PDF

  • 申请/专利权人 SILICON-BASED TECHNOLOGY CORP.;

    申请/专利号US20030356187

  • 发明设计人 CHING-YUAN WU;

    申请日2003-01-30

  • 分类号G11C160/40;

  • 国家 US

  • 入库时间 2022-08-21 23:15:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号