首页> 外国专利> Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing

Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing

机译:基于波导的并行多相移干涉仪,用于高速计量,光学检查和非接触式传感

摘要

An interferometer that contains a tri-coupler to mix light from three different waveguides. The light is emitted from a light source and may be reflected from a test surface. The output of the tri-coupler may be three different light beams that have intensities 120 degrees out of phase from each other. The out-of-phase light beams may be detected by a plurality of photodetectors. The detected out-of-phase light beams may be used to determine a height of the test surface. The waveguides and tri-coupler provide a compact and relatively inexpensive interferometer.
机译:包含三耦合器的干涉仪,用于混合来自三个不同波导的光。该光从光源发射并且可以从测试表面反射。三耦合器的输出可以是三个不同的光束,它们的强度彼此异相120度。异相光束可以由多个光电检测器检测。所检测到的异相光束可以用于确定测试表面的高度。波导和三耦合器提供了紧凑且相对便宜的干涉仪。

著录项

  • 公开/公告号US6687008B1

    专利类型

  • 公开/公告日2004-02-03

    原文格式PDF

  • 申请/专利权人 KLA-TENCOR CORPORATION;

    申请/专利号US20000694849

  • 发明设计人 CARLOS DURAN;HARALD HESS;DAVID PEALE;

    申请日2000-10-19

  • 分类号G01B90/20;

  • 国家 US

  • 入库时间 2022-08-21 23:13:11

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