Monolithic i-load architectures for automatic test equipment

摘要

An active load circuit for automatic test equipment that tests integrated circuits. The active load circuit includes a current source; a current sink; a current switching switching circuit having current source and current sink nodes respectively connected to the current source and the current sink; and a control circuit for controlling the current switching circuit with a differential voltage that is limited in amplitude and of the same polarity as a voltage difference between a fixed reference voltage and a pin output voltage of a device under test.