ELEMENT-SPECIFIC X-RAY FLUORESCENCE MICROSCOPE USING MULTIPLE IMAGING SYSTEMS COMPRISING A ZONE PLATE

摘要

An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The preferential imaging of the optical train is achieved using a chromatic lens in a suitably configured imaging system. A zone plate is an example of such a chromatic lens; its focal length is inversely proportional to the X-ray wavelength. Enhancement of preferential imaging of a given element in the test sample can be obtained if the zone plate lens itself is made of a compound containing substantially the same element. For example, when imaging copper using the Cu La spectral line, a copper zone plate lens is used. Furthermore, multiple imaging systems are used to increase throughput and to perform stereoscopic or tomographic imaging.