首页> 外国专利> METHODS AND APPARATUS FOR ELECTRICAL, MECHANICAL AND/OR CHEMICAL REMOVAL OF CONDUCTIVE MATERIAL FROM A MICROELECTRONIC SUBSTRATE

METHODS AND APPARATUS FOR ELECTRICAL, MECHANICAL AND/OR CHEMICAL REMOVAL OF CONDUCTIVE MATERIAL FROM A MICROELECTRONIC SUBSTRATE

机译:从微电子基质中去除导电材料的电,机械和/或化学物质的方法和装置

摘要

A method and apparatus for removing conductive material from a microelectronic substrate. In one embodiment, a support member supports a microelectronic substrate relative to first and second electrodes, which are spaced apart from each other and spaced apart from the microelectronic substrate. One or more electrolytes are disposed between the electrodes and the microelectronic substrate to electrically link the electrodes to the microelectronic substrate. The electrodes are then coupled to a source of varying current that electrically removes the conductive material from the substrate. The microelectronic substrate and/or the electrodes can be moved relative to each other to position the electrodes relative to a selected portion of the microelectronic substrate, and the electrodes can be integrated with a planarizing portion of the apparatus to remove material from the conductive layer by chemical-mechanical planarization.
机译:一种用于从微电子衬底去除导电材料的方法和设备。在一个实施例中,支撑构件相对于第一电极和第二电极支撑微电子基板,所述第一电极和第二电极彼此间隔开并且与微电子基板间隔开。一种或多种电解质设置在电极和微电子基板之间,以将电极电连接至微电子基板。然后将电极耦合到变化的电流源,该电流从衬底上电去除导电材料。微电子基板和/或电极可以相对于彼此移动,以相对于微电子基板的选定部分定位电极,并且电极可以与设备的平坦化部分集成在一起,以通过以下方式从导电层去除材料:化学机械平面化。

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