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NONDESTRUCTIVE ANALYSIS METHOD AND NONDESTRUCTIVE ANALYSIS DEVICE AND SPECIFIC OBJECT BY THE METHODDEVICE

机译:非破坏性分析方法,非破坏性分析装置及特定对象

摘要

By making the monochromatic parallel X-rays (1) irradiate an object (2), making the refracted X-rays and others (3) from the object (2) incident on a transmission-type analyzer crystal (4a), making the refracted X-rays and others (3) analyzed due to the dynamical diffraction action by the transmission type crystal analyzer (4a) into the X-rays along the forward diffraction direction (41a) and the X-rays along the diffraction direction (42a) the thickness of the transmission-type crystal analyzer (4a) is initially set to such a thickness that when there is no object, either the X-rays along the forward diffraction direction (41a) or the X-rays along the diffraction direction (42a) has intensity of approximately zero as compared to the intensity of the other in terms of the intensity of the X-rays less affected by the X-rays incident directly, a novel nondestructive analysis method and a nondestructive analysis device capable of providing a high contrast image inside the object is provided by a single shot and easily.
机译:通过使单色平行X射线(1)照射物体(2),使来自物体(2)的折射的X射线等(3)入射到透射型分析仪晶体(4a)上,从而使折射由于透射型晶体分析仪(4a)的动态衍射作用而将X射线等(3)分析为沿正向衍射方向(41a)的X射线和沿衍射方向(42a)的X射线。首先,将透射型晶体分析仪(4a)的厚度设定为在没有物体时沿正向衍射方向(41a)的X射线或沿衍射方向(42a)的X射线的厚度。就较少受直接入射的X射线影响的X射线的强度而言,具有与其他强度相比大约为零的强度,能够提供高对比度图像的新颖的非破坏性分析方法和非破坏性分析装置对象内部是provid单次轻松编辑。

著录项

  • 公开/公告号EP1429138A1

    专利类型

  • 公开/公告日2004-06-16

    原文格式PDF

  • 申请/专利权人 ANDO MASAMI;

    申请/专利号EP20020743766

  • 发明设计人 ANDO MASAMI;

    申请日2002-06-28

  • 分类号G01N23/04;G01N23/207;

  • 国家 EP

  • 入库时间 2022-08-21 22:52:15

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