首页> 外国专利> METHOD OF DEPOSITING METALLIC OXIDE THIN FILM USING MOCVD FOR OBTAINING RESISTIVE MEMORY MATERIALS

METHOD OF DEPOSITING METALLIC OXIDE THIN FILM USING MOCVD FOR OBTAINING RESISTIVE MEMORY MATERIALS

机译:用MOCVD沉积金属氧化物薄膜的方法获得电阻记忆材料。

摘要

PURPOSE: A method of depositing a metallic oxide thin film using an MOCVD(Metal Organic Chemical Vapor Deposition) is provided to obtain resistive memory materials with variable resistance characteristics. CONSTITUTION: An alkoxide precursor is introduced into a reactor(10) with a loaded substrate(12). The second metal-containing precursor is introduced into the reactor. At this time, a metal-containing film is completed on the substrate. The metal-containing film has a formula of M'xM"(1-x)MyOz. The M' is one selected from a group consisting of La, Ce, Pr, Nd, Pm, Sm, Y, Sc, Yb, Lu, and Gd. The M'' is one selected from the group consisting of Mg, Ca, Sr, Ba, Pb, Zn, and Cd. The M is one selected from the group consisting of Mn, Ce, V, Fe, Co, Nb, Ta, Cr, Mo, W, Zr, Hf and Ni. The x has a value from 0 to 1. The y has a value of 0, 1 or 2. The z has an integer value of 1 through 7.
机译:目的:提供一种使用MOCVD(金属有机化学气相沉积)沉积金属氧化物薄膜的方法,以获得具有可变电阻特性的电阻存储材料。组成:将烷氧化物前体引入具有负载的底物(12)的反应器(10)中。将第二种含金属的前体引入反应器中。此时,在基板上完成含金属膜。含金属膜的分子式为M'xM”(1-x)MyOz。M'是选自La,Ce,Pr,Nd,Pm,Sm,Y,Sc,Yb,Lu中的一种。 M”是选自Mg,Ca,Sr,Ba,Pb,Zn和Cd中的一种。M是选自Mn,Ce,V,Fe,Co中的一种。 Nb,Ta,Cr,Mo,W,Zr,Hf和Ni。x的取值范围是0到1。y的取值范围是0、1或2。z的取值范围是1到7。

著录项

  • 公开/公告号KR20040055594A

    专利类型

  • 公开/公告日2004-06-26

    原文格式PDF

  • 申请/专利权人 SHARP CORPORATION;

    申请/专利号KR20030090950

  • 发明设计人 PAN WEI;HSU SHENGTENG;ZHUANG WEIWEI;

    申请日2003-12-13

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 22:48:44

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