首页> 外国专利> - Method for in-situ fabrication of intrinsic-Josephson-junction mesa of high temperature superconducting single crystals and ion-beam etching apparatus used therein

- Method for in-situ fabrication of intrinsic-Josephson-junction mesa of high temperature superconducting single crystals and ion-beam etching apparatus used therein

机译:-高温超导单晶的本征-约瑟夫逊结台面的原位制造方法及其所用的离子束刻蚀装置

摘要

PURPOSE: A method for fabricating an intrinsic Josephson junction platform is provided to accurately control the number of intrinsic Josephson junctions formed in a high-temperature superconductor platform structure by etching a high-temperature superconductor single crystal in a condition of low vacuum and low temperature and by performing an in-situ process for measuring the electrical characteristic of the intrinsic Josephson junction in the platform structure. CONSTITUTION: The c-axis direction of a unit cell is made vertical to a substrate to fix a high temperature superconductor single crystal(14) to the substrate. The ab surface of the single crystal is exposed. A conductive metal thin film(16) is deposited on the ab surface of the single crystal. A plurality of platform structures are formed in which the metal thin film is stacked on the single crystal. The gap between the plurality of platform structures is filled to insulate the side surface of the platform structure and the exposed surface of the single crystal and to form an insulation layer pattern(18) for separating the metal thin films on the plurality of platform structure. A plurality of mutually-separated electrode patterns are formed on the separated metal thin film. The electrode pattern and the metal thin film under the electrode pattern that are stacked on at least one platform structure among the plurality of platform structures are etched and separated so that a curve of a voltage characteristic with respect to a transmission current on the platform to be measured can be obtained by a four terminal method.
机译:目的:提供一种制造本征约瑟夫逊结平台的方法,以通过在低真空和低温条件下蚀刻高温超导体单晶来精确控制在高温超导体平台结构中形成的本征约瑟夫逊结的数量。通过执行原位过程来测量平台结构中本征约瑟夫森结的电气特性。组成:将晶胞的c轴方向垂直于基板,以将高温超导体单晶(14)固定在基板上。单晶的ab表面被暴露。导电金属薄膜(16)沉积在单晶的ab表面上。形成多个平台结构,其中金属薄膜堆叠在单晶上。填充多个平台结构之间的间隙,以使平台结构的侧面和单晶的暴露表面绝缘,并形成用于分离多个平台结构上的金属薄膜的绝缘层图案(18)。在分离的金属薄膜上形成多个相互分离的电极图案。蚀刻并分离堆叠在多个平台结构中的至少一个平台结构上的电极图案和电极图案下面的金属薄膜,以使电压特性相对于要在平台上的传输电流的曲线成为曲线。可以通过四端子法获得测量值。

著录项

  • 公开/公告号KR20040061652A

    专利类型

  • 公开/公告日2004-07-07

    原文格式PDF

  • 申请/专利权人 POSTECH FOUNDATION;

    申请/专利号KR20020087936

  • 发明设计人 DO YONG JU;LEE HU JONG;

    申请日2002-12-31

  • 分类号H01L39/22;

  • 国家 KR

  • 入库时间 2022-08-21 22:48:31

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