首页> 外国专利> CLEANING SOLUTION AND CLEANING METHOD USING THE SAME TO PERFORM MINIMAL MACHINING ON SEMICONDUCTOR SUBSTRATE WITHOUT CORRODING INTERCONNECTION MATERIAL

CLEANING SOLUTION AND CLEANING METHOD USING THE SAME TO PERFORM MINIMAL MACHINING ON SEMICONDUCTOR SUBSTRATE WITHOUT CORRODING INTERCONNECTION MATERIAL

机译:使用相同的材​​料在不腐蚀互连材料的情况下对半导体基材进行最小加工的清洁解决方案和清洁方法

摘要

PURPOSE: A cleaning solution is provided to perform a minimal machining on a semiconductor substrate without corroding an interconnection material by easily eliminating etching residue on the semiconductor substrate within a short interval of time. CONSTITUTION: A cleaning solution for the semiconductor substrate contains an oxide agent, an acid and fluorine compound. Basic compound is added to water so that the pH(hydrogen ion concentration) of the wafer becomes 3-10, and the density of the water is not lower than 80 weight percent. The weight ratio of an acid to an oxide agent in the cleaning solution is 0.1-1000.
机译:目的:提供一种清洁溶液,以通过在短时间内轻松消除半导体衬底上的蚀刻残留物,从而在半导体衬底上进行最少的加工,而不会腐蚀互连材料。构成:用于半导体衬底的清洗液包含氧化物,酸和氟化合物。向水中添加碱性化合物,以使晶片的pH(氢离子浓度)变为3-10,并且水的密度不低于80重量%。清洗溶液中酸与氧化物的重量比为0.1-1000。

著录项

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号