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CLEANING SOLUTION AND CLEANING METHOD USING THE SAME TO PERFORM MINIMAL MACHINING ON SEMICONDUCTOR SUBSTRATE WITHOUT CORRODING INTERCONNECTION MATERIAL
CLEANING SOLUTION AND CLEANING METHOD USING THE SAME TO PERFORM MINIMAL MACHINING ON SEMICONDUCTOR SUBSTRATE WITHOUT CORRODING INTERCONNECTION MATERIAL
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机译:使用相同的材料在不腐蚀互连材料的情况下对半导体基材进行最小加工的清洁解决方案和清洁方法
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摘要
PURPOSE: A cleaning solution is provided to perform a minimal machining on a semiconductor substrate without corroding an interconnection material by easily eliminating etching residue on the semiconductor substrate within a short interval of time. CONSTITUTION: A cleaning solution for the semiconductor substrate contains an oxide agent, an acid and fluorine compound. Basic compound is added to water so that the pH(hydrogen ion concentration) of the wafer becomes 3-10, and the density of the water is not lower than 80 weight percent. The weight ratio of an acid to an oxide agent in the cleaning solution is 0.1-1000.
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