MEMORY MODULE CAPABLE OF TESTING INSTALLED MEMORY DEVICES AND MEMORY MODULE TEST METHOD THEREOF

摘要

Purpose: providing a memory module and its memory module testing method, and test installation memory device simultaneously easily finds out a defect memory device. Construction: a memory module includes data input/output lead, and some memory devices, it is connected to each data input/output lead and is selected and tests response input to a data input/output signal of the signal of data input/output lead and mode register storage in a mode register (MRS). A mode register command of selection signal is distinguished together with the set-up mode register and a chip for generating response data input/output signal, each memory selection is inputted by an address signal.