首页> 外国专利> WAFER DRY APPARATUS OF SPIN DRYER AND DRIVING METHOD THEREOF TO PREVENT BREAKING PHENOMENON OF WAFER

WAFER DRY APPARATUS OF SPIN DRYER AND DRIVING METHOD THEREOF TO PREVENT BREAKING PHENOMENON OF WAFER

机译:旋转式干燥机的晶圆干燥装置及其驱动方法,可防止晶圆断裂现象

摘要

PURPOSE: A wafer dry apparatus for a spin dryer and a driving method thereof are provided to prevent a breaking phenomenon of a wafer by removing a rinsing solution from the wafer in a low-speed rotating state of a spin motor. CONSTITUTION: A controller(30) removes residual liquid from a surface of a wafer by injecting a cleaning gas onto the wafer. A vacuum chuck(34) is used for absorbing and supporting the wafer and rotating the wafer. A plurality of injection nozzles(38a,38b) are used for injecting deionized water onto the wafer according to a control command of the controller. A rotary unit(32) changes rotatory power of the vacuum chuck according to the control command of the controller. A gas supply source(50) is used for supply a cleaning gas. A gas pressure gauge(52) is used for measuring, controlling, and displaying the pressure of the cleaning gas. An air valve(54) is used for supplying or interrupting the cleaning gas. A gas injection nozzle is installed at one end of a gas supply tube in order to remove a rinsing solution from the wafer.
机译:目的:提供一种用于旋转干燥器的晶片干燥设备及其驱动方法,以通过在旋转电动机的低速旋转状态下从晶片上去除冲洗溶液来防止晶片的破裂现象。组成:控制器(30)通过将清洁气体注入到晶片上来去除晶片表面上的残留液体。真空吸盘(34)用于吸收和支撑晶片并旋转晶片。多个喷嘴(38a,38b)用于根据控制器的控制命令将去离子水注入到晶片上。旋转单元(32)根据控制器的控制指令改变真空吸盘的旋转动力。气体供应源(50)用于供应清洁气体。气压计(52)用于测量,控制和显示清洁气体的压力。空气阀(54)用于供应或中断清洁气体。气体喷嘴安装在气体供应管的一端,以从晶片上去除冲洗溶液。

著录项

  • 公开/公告号KR20040085245A

    专利类型

  • 公开/公告日2004-10-08

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030019878

  • 发明设计人 LEE DEOK YEOL;

    申请日2003-03-31

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号