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WAFER DRY APPARATUS OF SPIN DRYER AND DRIVING METHOD THEREOF TO PREVENT BREAKING PHENOMENON OF WAFER
WAFER DRY APPARATUS OF SPIN DRYER AND DRIVING METHOD THEREOF TO PREVENT BREAKING PHENOMENON OF WAFER
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机译:旋转式干燥机的晶圆干燥装置及其驱动方法,可防止晶圆断裂现象
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摘要
PURPOSE: A wafer dry apparatus for a spin dryer and a driving method thereof are provided to prevent a breaking phenomenon of a wafer by removing a rinsing solution from the wafer in a low-speed rotating state of a spin motor. CONSTITUTION: A controller(30) removes residual liquid from a surface of a wafer by injecting a cleaning gas onto the wafer. A vacuum chuck(34) is used for absorbing and supporting the wafer and rotating the wafer. A plurality of injection nozzles(38a,38b) are used for injecting deionized water onto the wafer according to a control command of the controller. A rotary unit(32) changes rotatory power of the vacuum chuck according to the control command of the controller. A gas supply source(50) is used for supply a cleaning gas. A gas pressure gauge(52) is used for measuring, controlling, and displaying the pressure of the cleaning gas. An air valve(54) is used for supplying or interrupting the cleaning gas. A gas injection nozzle is installed at one end of a gas supply tube in order to remove a rinsing solution from the wafer.
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