首页> 外国专利> METHOD FOR INVESTIGATING DRIVER CIRCUIT AND APPARATUS THEREOF, ESPECIALLY DRIVING GATE LINES BY GATE DRIVING CELLS TO DETECT ERRORS OF GATE LINES SIMULTANEOUSLY

METHOD FOR INVESTIGATING DRIVER CIRCUIT AND APPARATUS THEREOF, ESPECIALLY DRIVING GATE LINES BY GATE DRIVING CELLS TO DETECT ERRORS OF GATE LINES SIMULTANEOUSLY

机译:用于研究驱动器电路及其装置的方法,特别是通过门驱动单元来驱动门线以同时检测门线的误差

摘要

PURPOSE: A method for investigating a driver circuit and apparatus thereof are provided to perform investigation and defect recovery of the driver circuit in a liquid crystal display rapidly. CONSTITUTION: According to the apparatus for investigating a driver circuit for liquid crystal display device having a number of gate driving cells(GD1-GDn), a test signal supply unit(34) supplies a test signal to the gate lines in parallel. A latch control unit latches the test and start signals to each gate driving cell. A signal branch unit replaces the test signal supplied to the gate lines with signals latched to the gate driving cells. And a detection unit detects each enable state of the gate lines.
机译:目的:提供一种用于研究驱动器电路的方法及其设备,以快速进行液晶显示器中的驱动器电路的研究和缺陷修复。构成:根据用于研究具有多个栅极驱动单元(GD1-GDn)的液晶显示装置的驱动器电路的装置,测试信号提供单元(34)将测试信号并行地提供给栅极线。闩锁控制单元将测试和开始信号闩锁到每个栅极驱动单元。信号分支单元用锁存在栅极驱动单元的信号代替提供给栅极线的测试信号。检测单元检测栅极线的每个使能状态。

著录项

  • 公开/公告号KR100430096B1

    专利类型

  • 公开/公告日2004-07-15

    原文格式PDF

  • 申请/专利权人 LG.PHILIPS LCD CO. LTD.;

    申请/专利号KR19980054547

  • 发明设计人 KIM SEONG GYUN;

    申请日1998-12-11

  • 分类号G09G3/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:10

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