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METHOD OF INTERFERENCE MEASUREMENT OF FORM OF SURFACE OF OPTICAL PARTS

机译:光学零件表面形式的干涉测量方法

摘要

FIELD: measurement technology. SUBSTANCE: method of interference measurement of form of surface of optical parts includes recording of interference picture by photography on transparent carrier, illumination of recorded interferogram in angle interval from β to α+β, where α is angle of light diffusion by interferogram; β- is front aperture angle of analyzing optical system, and subsequent analysis of light image. Interferogram is also illuminated by second light source in angle interval from 0 to β, Inteferogram is illuminated by first and second light sources in antiphase. EFFECT: expanded functional potential of method of observation of interference fringes in light diffusion. 1 dwg
机译:领域:测量技术。物质:光学部件表面形式的干涉测量方法包括:通过在透明载体上的摄影来记录干涉图像,以β为角度间隔以角度间隔照射记录的干涉图。到α +&beta ;,其中α是干涉图的光扩散角度; β-是分析光学系统并随后分析光图像的前孔径角。干涉图也被第二光源以从0到β的角度间隔照亮。干涉图也被第一和第二光源反相地照亮。效果:观察光扩散中干涉条纹的方法的功能扩展。 1载重吨

著录项

  • 公开/公告号RU2224982C2

    专利类型

  • 公开/公告日2004-02-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号RU19990123152

  • 发明设计人 NOSKOV M.F.;

    申请日1999-11-01

  • 分类号G01B11/24;

  • 国家 RU

  • 入库时间 2022-08-21 22:45:10

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