首页> 外国专利> Improving calibration parameters for three-dimensional x-ray reconstruction involves changing calibration parameters so that reconstructed volumes have very sharp edges and hence high frequencies

Improving calibration parameters for three-dimensional x-ray reconstruction involves changing calibration parameters so that reconstructed volumes have very sharp edges and hence high frequencies

机译:改善三维X射线重建的校准参数涉及更改校准参数,以使重建的体积具有非常锋利的边缘,因此高频

摘要

The method involves carrying out an off-line calibration in the first instance. Calibration parameters are altered so that the reconstructed volumes have very sharp edges and hence have high frequencies. The degrees of freedom of the projection imaging are limited to one or more of the extrinsic parameters and the others are accepted as constants.
机译:该方法涉及首先进行离线校准。更改校准参数,以使重建的体积具有非常尖锐的边缘,因此具有很高的频率。投影成像的自由度限于一个或多个外部参数,而其他参数则被接受为常数。

著录项

  • 公开/公告号DE10227306A1

    专利类型

  • 公开/公告日2004-01-15

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2002127306

  • 发明设计人 HORNEGGER JOACHIM;

    申请日2002-06-19

  • 分类号G06T17/00;G06T5/00;H05G1/61;

  • 国家 DE

  • 入库时间 2022-08-21 22:44:11

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