首页> 外国专利> Production of column regions in semiconductor wafers used in the production of high voltage transistors comprises depositing alternating n-doped and p-doped epitaxial layer sections on a semiconductor substrate, and further processing

Production of column regions in semiconductor wafers used in the production of high voltage transistors comprises depositing alternating n-doped and p-doped epitaxial layer sections on a semiconductor substrate, and further processing

机译:在用于制造高压晶体管的半导体晶片中制造列区域的步骤包括在半导体衬底上沉积交替的n掺杂和p掺杂外延层部分,并进行进一步处理

摘要

Production of column regions (S) having a first conductivity type (n) in semiconductor wafers comprises depositing alternating n-doped and p-doped epitaxial layer sections (11, 12) on a semiconductor substrate (10), forming a topology step in or on the epitaxial layers (12), and converting the p-doped layers into n-doped layer sections using high energy implantation. Independent claims are also included for the following: (1) Trench transistor arrangement containing the doped column regions; and (2) Transistor array containing trench transistor arrangements.
机译:在半导体晶片中产生具有第一导电类型(n)的列区域(S)的步骤包括在半导体衬底(10)上沉积交替的n掺杂和p掺杂的外延层部分(11、12),在其中形成拓扑步骤。在外延层(12)上,用高能注入将p掺杂层转换成n掺杂层部分。还包括以下方面的独立权利要求:(1)包含掺杂的列区域的沟槽晶体管装置; (2)包含沟槽晶体管装置的晶体管阵列。

著录项

  • 公开/公告号DE10239868A1

    专利类型

  • 公开/公告日2004-03-18

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2002139868

  • 发明设计人 RUEB MICHAEL;

    申请日2002-08-29

  • 分类号H01L21/336;H01L21/331;H01L29/78;H01L29/739;

  • 国家 DE

  • 入库时间 2022-08-21 22:44:02

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号