首页> 外国专利> Scanning probe microscopy is based on detection and spectral analysis of natural thermal electromagnetic near fields on surface

Scanning probe microscopy is based on detection and spectral analysis of natural thermal electromagnetic near fields on surface

机译:扫描探针显微镜基于表面自然热电磁近场的检测和光谱分析

摘要

The method (FNFM) is based on detection and spectral analysis of natural thermal electromagnetic near fields on a surface. Spectral analysis of the FNFM signal determines local surface chemical composition. Chemical composition of gaseous substances near the sensor is determined by spectral analysis of rotational resonances. To detect high frequency (THz) near fields, a coherent microwave oscillator is used to produce a heterodyne in the HF band, by mixing. This is detected and analyzed in accordance with the independent claim. For detection of high frequency near fields in the infra red and optical bands, a tuned laser is used for heterodyning and corresponding analysis. Spin relaxation and magnetic properties exhibited in an external magnetic field, are analyzed locally using the FNFM method. Local temperature is determined with nanometer resolution, using this method. Dielectric properties of a surface are measured. Hidden, noise-emitting particles under non-noise generating materials are examined.
机译:该方法(FNFM)基于表面上自然热电磁近场的检测和光谱分析。 FNFM信号的光谱分析确定了局部表面化学成分。通过旋转共振的频谱分析确定传感器附近的气态物质的化学成分。为了检测场附近的高频(THz),使用相干微波振荡器通过混合在HF波段产生外差。根据独立权利要求对此进行检测和分析。为了检测红外和光学波段中的高频近场,使用了调谐激光器进行外差法和相应的分析。使用FNFM方法对外部磁场中表现出的自旋弛豫和磁性能进行局部分析。使用此方法,可以纳米分辨率确定局部温度。测量表面的介电性能。检查非噪音产生材料下隐藏的,发出噪音的颗粒。

著录项

  • 公开/公告号DE10259118A1

    专利类型

  • 公开/公告日2004-05-19

    原文格式PDF

  • 申请/专利权人 FUCHS HARALD;JERSCH JOHANN;

    申请/专利号DE20021059118

  • 发明设计人 ERFINDER WIRD SPÄTER GENANNT WERDEN;

    申请日2002-12-18

  • 分类号G12B21/10;G01N13/22;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:37

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号