首页> 外国专利> Position measurement signal analysis method, for workpiece of e.g. milling machine, compares measurement signal with reference signal formed by combining information signal with interference signal

Position measurement signal analysis method, for workpiece of e.g. milling machine, compares measurement signal with reference signal formed by combining information signal with interference signal

机译:位置测量信号分析方法,适用于例如铣床,将测量信号与参考信号进行比较,参考信号是通过将信息信号与干扰信号相结合而形成的

摘要

A probe produces infrared transmission signals when moved from its rest position. The transmission signals are combined with interference signals to form a reception signal, from which an information signal is obtained. A reference signal is formed by combining the information signal with the interference signal through addition or subtraction. The reception signal is then compared with the reference signal to determine the position of the probe. An independent claim is included for an arrangement for evaluating reception signals.
机译:从其静止位置移动时,探头会产生红外透射信号。将发送信号与干扰信号组合以形成接收信号,从该接收信号获得信息信号。通过将信息信号与干扰信号通过加法或减法组合而形成参考信号。然后将接收信号与参考信号进行比较,以确定探头的位置。对于评估接收信号的装置包括独立权利要求。

著录项

  • 公开/公告号DE10304195A1

    专利类型

  • 公开/公告日2004-08-05

    原文格式PDF

  • 申请/专利权人 DR. JOHANNES HEIDENHAIN GMBH;

    申请/专利号DE2003104195

  • 发明设计人 GROELL KLAUS;EISENBERGER CHRISTIAN;

    申请日2003-01-29

  • 分类号G01B21/04;G08C17/02;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:31

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