Reflective surface analysis method for inspecting/checking a reflective shiny mirror-like surface moves/changes an existing or created pattern to produce images on a surface at different times

摘要

A pattern that exists and/or is created near to a surface (10') is moved and/or changed. Each image of the pattern reflected on the surface is picked up at different points of time, e.g. before, once or several times during and after the pattern is moved and/or changed. An independent claim is also included for a device for inspecting/checking a reflective shiny mirror-like surface.