首页> 外国专利> Integrated circuit has device for selecting either internal or external reference voltage as integrated circuit reference voltage at least partly depending upon whether it is in test or non-test mode

Integrated circuit has device for selecting either internal or external reference voltage as integrated circuit reference voltage at least partly depending upon whether it is in test or non-test mode

机译:集成电路具有用于至少部分地取决于其处于测试还是非测试模式中来选择内部或外部参考电压作为集成电路参考电压的装置

摘要

The integrated circuit (10) references signals to a reference voltage to determine their logic levels, is configured for connection to an external reference voltage and has test mode and non-test modes, a device for generating an internal reference voltage and a device for selecting either the internal or external reference voltage as the integrated circuit reference voltage at least partly depending upon whether it is in test or non-test mode. An Independent claim is also included for a method of selecting between an internal and an external reference voltage.
机译:集成电路(10)将信号参考到参考电压以确定其逻辑电平,被配置为连接到外部参考电压并且具有测试模式和非测试模式,用于生成内部参考电压的设备以及用于选择信号的设备。内部参考电压还是外部参考电压作为集成电路参考电压至少部分取决于它是处于测试还是非测试模式。还包括关于在内部参考电压和外部参考电压之间进行选择的方法的独立权利要求。

著录项

  • 公开/公告号DE10319119A1

    专利类型

  • 公开/公告日2003-11-27

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003119119

  • 发明设计人 BAKER RONALD N.;

    申请日2003-04-28

  • 分类号G01R31/28;G01R31/303;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:16

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