首页> 外国专利> Adaptation of magnetic resonance metrology record to investigated object, by analyzing measuring data to determine geometric parameters to describe the maximum expansion of the object in each measured dimension

Adaptation of magnetic resonance metrology record to investigated object, by analyzing measuring data to determine geometric parameters to describe the maximum expansion of the object in each measured dimension

机译:通过分析测量数据以确定几何参数来描述每个测量维度上对象的最大膨胀,从而使磁共振计量记录适应被调查对象

摘要

Magnetic resonance localization measurement is executed with respect to an investigated object to obtain measuring data (M2). The measuring data is then analyzed to determine the geometric parameters (M4) to describe the maximum expansion of the object in each measured dimension. The magnetic resonance metrology record (M5) is then adapted to the geometric parameters.
机译:对检查对象进行磁共振定位测量以获得测量数据(M2)。然后分析测量数据以确定几何参数(M4),以描述物体在每个测量尺寸中的最大膨胀。然后将磁共振计量记录(M5)适配于几何参数。

著录项

  • 公开/公告号DE10322141A1

    专利类型

  • 公开/公告日2004-09-02

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2003122141

  • 发明设计人 NIMSKY INES;

    申请日2003-05-16

  • 分类号A61B5/055;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:16

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