首页> 外国专利> kurzkanal fermi schwellenspannungsfeldeffekttransistor with drain field anschlusszone and methods of manufacture

kurzkanal fermi schwellenspannungsfeldeffekttransistor with drain field anschlusszone and methods of manufacture

机译:具有漏场连接区的短沟道费米阈值电压场效应晶体管及其制造方法

摘要

A Fermi-FET includes a drain field termination region between the source and drain regions, to reduce and preferably prevent injection of carriers from the source region into the channel as a result of drain bias. The drain field terminating region prevents excessive drain induced barrier lowering while still allowing low vertical field in the channel. The drain field terminating region is preferably embodied by a buried counterdoped layer between the source and drain regions, extending beneath the substrate surface from the source region to the drain region. The buried counterdoped layer may be formed using a three tub structure which produces three layers between the spaced apart source and drain regions. The drain field terminating region may also be used in a conventional MOSFET. The channel region is preferably formed by epitaxial deposition, so that the channel region need not be counterdoped relative to the drain field terminating region. Higher carrier mobility in the channel may thereby be obtained for a given doping level.
机译:费米FET在源极和漏极区域之间包括漏极场终止区域,以减少并且优选地防止由于漏极偏置而将载流子从源极区域注入到沟道中。漏极场终止区可防止过多的漏极引起的势垒降低,同时仍允许沟道中的低垂直场。漏极场终止区优选地由在源极区和漏极区之间的掩埋反掺杂层来体现,该埋入反掺杂层在衬底表面下方从源极区延伸到漏极区。可以使用三盆结构形成掩埋的反掺杂层,该三盆结构在间隔开的源极区和漏极区之间产生三层。漏场终止区也可以用在常规的MOSFET中。沟道区优选地通过外延沉积形成,使得沟道区不需要相对于漏极场终止区反掺杂。对于给定的掺杂水平,从而可以在信道中获得更高的载流子迁移率。

著录项

  • 公开/公告号DE69728858D1

    专利类型

  • 公开/公告日2004-06-03

    原文格式PDF

  • 申请/专利权人 THUNDERBIRD TECHNOLOGIES INC.;

    申请/专利号DE19976028858T

  • 发明设计人 DENNEN WILLIAM;

    申请日1997-02-04

  • 分类号H01L29/78;H01L29/10;H01L21/336;

  • 国家 DE

  • 入库时间 2022-08-21 22:40:39

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