Determining the specular or diffuse reflectance profile amp; emittance of materials at ambient temperature

摘要

The method comprises the steps of: obtaining the wavelength, refractive index, extinction coefficient, and angle incidence from the user(2); calculating absorption coefficient(3); prompting the user to choose between calculation of reflectance and the calculation of specular reflectance and calculation of diffuse reflectance (4). If specular reflectance is selected by the user (5); calculating u, v, parallel component of specular reflectance, Rs, perpendicular component of reflectance, Rp, and calculating the mean of the parallel and perpendicular components thus obtained to obtain the specular reflectance (6). If diffuse reflectance is selected (8), prompting the user to select between K-M method (9) and statistical method (10). If K-M method is selected by the user (25, fig. 1d), obtaining scattering coefficient, S, from the user, and calculating diffuse reflectance. If statistical method is chosen (10, fig. 1b), obtaining grain size from the user and calculating external reflection coefficient, me and internal reflection coefficient, mi; calculating 'r' and 't' using any of the following four statistical methods: SPMT, MPMT, PPM, or Melamed Theory.