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ARTICLE INSPECTION DEVICE, ARTICLE INSPECTION SYSTEM, AND ARTICLE INSPECTION METHOD

机译:物品检查装置,物品检查系统以及物品检查方法

摘要

PROBLEM TO BE SOLVED: To inspect an article by using a detection part which is optimum even if a space for setting a detection part in an inspection device is small, while capable of easily attaching/detaching the optional detection part in accordance with the kind of an article to be inspected.;SOLUTION: The inspection device determines a connection state of the inspection device and an optional detection part attachable to and detachable from the inspection device, which inspects an article by using a plurality of detection parts. An optional detection part to be used for inspecting the article is selected from the optional detection parts which are determined to be connected based on the determination, and the article is inspected by using the optional detection part thus selected.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:即使在检查装置中用于设置检测部的空间较小的情况下,也能够通过使用最合适的检测部来检查物品,并且能够根据物品的种类容易地装卸可选的检测部。解决方案:解决方案:检查装置确定检查装置与可装卸到检查装置上的可选检测部件的连接状态,该检测装置通过使用多个检测部件来检查物品。从确定的基础上确定要连接的可选检测部分中选择要用于检查物品的可选检测部分,并使用由此选择的可选检测部分来检查物品。版权所有:(C)2005 ,JPO&NCIPI

著录项

  • 公开/公告号JP2005258581A

    专利类型

  • 公开/公告日2005-09-22

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20040066112

  • 发明设计人 SUWA MITSUO;

    申请日2004-03-09

  • 分类号G07D7/00;G06F17/60;

  • 国家 JP

  • 入库时间 2022-08-21 22:35:36

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