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MEASURING INSTRUMENT FOR TRACE OF COMPONENT IN GAS AND MEASURING METHOD USING IT

机译:气体中微量元素的测量仪器及其测量方法

摘要

PROBLEM TO BE SOLVED: To provide a simple and rapid measuring instrument of a trace of a component in gas, and a measuring method using it.;SOLUTION: This measuring instrument of a trace of the component in the gas is equipped with a vacuum cell 12 provided with a vacuum pump 11, a sample introducing pipe 14 for introducing an exhaust gas 13 into the vacuum cell 12, a plasma forming device 15 for forming the plasma of a trace of the component in the exhaust gas 13 supplied into the vacuum cell 12 and a photodetector 17 for detecting the peripheral region of the plasma light 16 emitted from the component. Detection light L is measured in the measuring part 28 of the peripheral region of the plasma light 16.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种简单,快速的气体中痕量测量仪器及其测量方法。解决方案:此气体中的痕量测量仪器配备了真空室在图12中,设有真空泵11,用于将排气13导入真空室12的试样导入管14,用于形成被供给到真空室的排气13中的微量的成分的等离子体的等离子体形成装置15。 12和一个光电检测器17,用于检测从组件发出的等离子光16的外围区域。在等离子光16的周边区域的测量部分28中测量检测光L; COPYRIGHT:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005164288A

    专利类型

  • 公开/公告日2005-06-23

    原文格式PDF

  • 申请/专利权人 MITSUBISHI HEAVY IND LTD;

    申请/专利号JP20030400329

  • 发明设计人 DEGUCHI YOSHIHIRO;HORI JUNICHIRO;

    申请日2003-11-28

  • 分类号G01N21/63;G01N21/67;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:57

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