首页> 外国专利> LOW-TEMPERATURE DIFFUSE REFLECTION MEASURING APPARATUS, SAMPLE HOLDER USED FOR THE SAME, AND LOW-TEMPERATURE DIFFUSE REFLECTION SPECTRUM MEASURING METHOD

LOW-TEMPERATURE DIFFUSE REFLECTION MEASURING APPARATUS, SAMPLE HOLDER USED FOR THE SAME, AND LOW-TEMPERATURE DIFFUSE REFLECTION SPECTRUM MEASURING METHOD

机译:低温扩散反射测定装置,同样使用的样品保持器以及低温扩散反射光谱测定方法

摘要

PROBLEM TO BE SOLVED: To provide a low-temperature diffuse reflection spectrum measuring apparatus for powder samples capable of preventing samples from freezing at low temperatures and easily measuring the diffuse reflection spectra of the powder samples at controlled temperatures.;SOLUTION: In the low-temperature diffuse reflection spectrum measuring apparatus 10 for powder samples, a cryostat 12; a powder sample holder 13 for measuring temperature changes and spectra connected to a cryostat heat conducting part 21 via a heat conducing plate 22 and a heat conductor 18 for holding a powder sample in the vicinity of an inner side of a cryostat optical window 28; and a diffuse reflection photo-detecting means provided with both an integrating sphere 14 and a detector 16 are combined.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种用于粉末样品的低温漫反射光谱测量设备,该设备能够防止样品在低温下冻结,并易于在受控温度下测量粉末样品的漫反射光谱。用于粉末样品的温度漫反射光谱测量设备10,低温恒温器12;用于测量温度变化和光谱的粉末样品保持器13通过导热板22和用于将粉末样品保持在低温恒温器光学窗口28的内侧附近的导热体18连接到低温恒温器导热部分21。 (C)2005,JPO&NCIPI;和结合有积分球14和检测器16的漫反射光检测装置。

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