首页> 外国专利> ACQUISITION METHOD OF GAMMA CHARACTERISTIC, ACQUISITION SYSTEM OF GAMMA CHARACTERISTIC, AND PROJECTION SYSTEM

ACQUISITION METHOD OF GAMMA CHARACTERISTIC, ACQUISITION SYSTEM OF GAMMA CHARACTERISTIC, AND PROJECTION SYSTEM

机译:伽玛特性的获取方法,伽玛特性的获取系统和投影系统

摘要

PPROBLEM TO BE SOLVED: To provide an acquisition method of gamma characteristic which is possible to achieve high precision considering effect of flare. PSOLUTION: The method includes a process S2 which photographs a calibration pattern projected from a image projection part, a process S3 which creates a flare influence reduction pattern for reducing effect of flare based on the image of the photographed calibration pattern, a process S4 which photographs the flare effect reduction pattern projected from an image projection means, and a process S5 which calculates gamma characteristic of the image projection part based on the image of the photographed flare effect reduction pattern. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:提供一种伽马特性的获取方法,考虑到耀斑的影响,该方法可以实现高精度。

解决方案:该方法包括拍摄从图像投影部分投影的校准图案的过程S2,基于拍摄的校准图案的图像创建耀斑影响减小图案以减小耀斑效果的过程S3,过程拍摄从图像投影装置投影的耀斑减少图案的S4,以及基于拍摄的耀斑减少图案的图像计算图像投影部的伽马特性的处理S5。

版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004328627A

    专利类型

  • 公开/公告日2004-11-18

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20030123956

  • 发明设计人 ISHII KENSUKE;

    申请日2003-04-28

  • 分类号H04N1/407;G06T5/00;H04N17/04;

  • 国家 JP

  • 入库时间 2022-08-21 22:33:48

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