首页> 外国专利> DOUBLE-SIDED POLISHING METHOD FOR SUBSTRATE, GUIDE RING FOR DOUBLE-SIDED POLISHING, AND DOUBLE-SIDED POLISHING DEVICE FOR SUBSTRATE

DOUBLE-SIDED POLISHING METHOD FOR SUBSTRATE, GUIDE RING FOR DOUBLE-SIDED POLISHING, AND DOUBLE-SIDED POLISHING DEVICE FOR SUBSTRATE

机译:基材的双面抛光方法,双面抛光的导向环和基材的双面抛光装置

摘要

PROBLEM TO BE SOLVED: To provide a double-sided polishing method, a guide ring for double-sided polishing, and a double-sided polishing device for providing high flatness.;SOLUTION: In the polishing method, the substrate W is held to the guide ring 1, and the guide ring 1 is moved between an upper polishing plate 2 and a lower polishing plate 4 with abrasive cloth 3, 5 stuck thereto, to simultaneously polish the front and rear faces of the substrate W while applying polishing load to the substrate W by the abrasive cloth 3, 5 of the upper and lower polishing plates 2, 4. In this method, at least the abrasive cloth 5 of the lower polishing plate 4 is pressed by the guide ring 1, and the pressing load to the abrasive cloth of the lower polishing plate 4 from the guide ring 1 is made 0.5-3 times of the polishing load to the substrate W from the abrasive cloth 5 of the lower polishing plate 4 to perform polishing. The guide ring for double-sided polishing is provided with a pressing means 12 for applying pressure to the lower polishing plate 4 or the upper and lower polishing plates 2, 4 from the front and rear faces of the guide ring 1. In the double-sided polishing device for the substrate, the guide ring 1 presses the abrasive cloth of the surface table, and the pressing load of the guide ring 1 is 0.5-3 times of the polishing load between the substrate W and the abrasive cloth 3, 4.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种双面抛光方法,一种用于双面抛光的导向环和一种用于提供高平坦度的双面抛光装置。解决方案:在抛光方法中,将衬底W固定在引导环1,并且引导环1在上面粘贴有砂布3、5的情况下在上抛光板2和下抛光板4之间移动,以同时抛光基板W的前表面和后表面,同时将抛光负荷施加到基板W上。基板W由上下研磨板2、4的研磨布3、5研磨。在这种方法中,至少下部研磨板4的研磨布5被导向环1按压,并且对基板W的按压力负荷。使来自引导环1的下部研磨板4的研磨布从下部研磨板4的研磨布5对基板W的研磨负荷为0.5-3倍,从而进行研磨。用于双面抛光的引导环设置有用于从引导环1的前表面和后表面向下部抛光板4或上部和下部抛光板2、4施加压力的按压装置12。侧抛光装置,将导向环1压在工作台的砂布上,导向环1的压紧载荷是基片W和砂布3、4之间的抛光载荷的0.5-3倍。 ;版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004330399A

    专利类型

  • 公开/公告日2004-11-25

    原文格式PDF

  • 申请/专利权人 SHIN ETSU CHEM CO LTD;

    申请/专利号JP20030133519

  • 发明设计人 NAKATSU MASAYUKI;MORIYA JIRO;

    申请日2003-05-12

  • 分类号B24B37/00;B24B37/04;

  • 国家 JP

  • 入库时间 2022-08-21 22:33:14

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