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MICRO-DISPLACEMENT MEASURING DEVICE

机译:微位移测量装置

摘要

PROBLEM TO BE SOLVED: To provide a compact and low-cost micro-displacement measuring device.;SOLUTION: In this micro-displacement measuring device, emitted light from two optical fibers is allowed to interfere, and micro-displacement is detected based on the phase shift quantity caused by the micro-displacement of a measuring object. The device is provided with a substrate for optical component array forming thereon a V-shaped groove 11a for holding a collimator lens 24 for converting laser light into parallel light, a U-shaped groove 12 for holding the first beam splitter 50 for branching the parallel light into reflected light and transmitted light and the second beam splitter 60 for totally reflecting light reflected by the measuring object 117 and returned, and V-shaped grooves 11b, 11c for holding the second and third collimator lenses 34, 44 for converging emitted light from the first and second beam splitters 50, 60. In the device, prescribed optical components are inserted precisely into each groove, and thereby assembly is facilitated, and manufacturing cost is reduced by dispensing with an optical axis adjustment work.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种紧凑且低成本的微位移测量设备。解决方案:在此微位移测量设备中,允许两条光纤发出的光发生干涉,并根据位移来检测微位移。由测量对象的微小位移引起的相移量。该装置设置有用于光学部件阵列的基板,在其上形成用于保持准直透镜24以将激光转换成平行光的V形凹槽11a,用于保持第一分束器50以使平行光束分支的U形凹槽12。光束分为反射光和透射光,第二分束器60用于使被测量对象117反射并返回的光全反射,V形凹槽11b,11c用于保持第二和第三准直透镜34、44会聚来自发射器的发射光。在该装置中,将规定的光学部件精确地插入每个凹槽中,从而便于组装,并且省去了光轴调整工作,从而降低了制造成本。版权所有:(C) 2005,日本特许厅

著录项

  • 公开/公告号JP2005207849A

    专利类型

  • 公开/公告日2005-08-04

    原文格式PDF

  • 申请/专利权人 SEIKOH GIKEN CO LTD;

    申请/专利号JP20040013844

  • 发明设计人 GO GIYOKUEI;

    申请日2004-01-22

  • 分类号G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-21 22:31:06

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