SAMPLING METHOD AND SYSTEM SHORTENING READOUT TIME AND REDUCING LAG IN AMORPHOUS SILICON FLAT PANEL X-RAY DETECTOR

摘要

PROBLEM TO BE SOLVED: To provide an amorphous silicon flat panel X-ray detector which uses a sampling method to shorten a readout time and reduce a lag.;SOLUTION: A predetermined radiographic image is obtained by: (a) activating a reset switch (44) to discharge a residual signal held in a feedback capacitor (45); (b) deactivating the reset switch; (c) activating a field effect transistor (42); (d) sampling an electrical signal from the amorphous silicon flat panel X-ray detector (22) while the field effect transistor is activated; (e) activating the reset switch after the electrical signal has been sampled and while the field effect transistor is still activated, to discharge the residual signal held in the feedback capacitor; (f) deactivating the field effect transistor while the reset switch is activated; (g) deactivating the reset switch; and (h) repeating the steps (c)-(g) as necessary.;COPYRIGHT: (C)2005,JPO&NCIPI