首页> 外国专利> NONCONTACT MEASURING METHOD OF SURFACE TEMPERATURE OF SAMPLE TO BE NATURALLY OR ARTIFICIALLY EXPOSED AND DEVICE THEREFOR

NONCONTACT MEASURING METHOD OF SURFACE TEMPERATURE OF SAMPLE TO BE NATURALLY OR ARTIFICIALLY EXPOSED AND DEVICE THEREFOR

机译:自然或人工暴露样品表面温度的非接触测量方法

摘要

PROBLEM TO BE SOLVED: To enhance the accuracy of surface temperature measurement for a sample for evaluation of deterioration with time depending on exposure of the sample when the sample is naturally or artificially exposed.;SOLUTION: A holding frame 2 is rotatably mounted on the circumference of a xenon radiation source 4 within an exposing chamber 1, and the xenon radiation source 4 is located on a cylinder or a rotating shaft, and a filter 5 is provided around it. The sample 3 to be exposed is fixed within the holding frame 2, and exposed to the radiation from the xenon radiation source 4. The surface temperature of the sample 3 is directly recorded by a black body radiation detector such as a pyrometer 6 turned to a fixed area of the space through which the sample 3 periodically passes during rotation. The surface temperature is calculated from the detected black body radiation in an evaluation circuit with an emissivity stored for a different sample 3.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:为了提高样品的表面温度测量的准确性,以便根据自然或人工暴露样品时样品的暴露程度来评估随时间的劣化。;解决方案:保持架2可旋转地安装在圆周上在曝光室1内的氙气辐射源4中,氙气辐射源4位于圆柱体或旋转轴上,并在其周围设置有过滤器5。待暴露的样品3被固定在保持框架2内,并暴露于来自氙辐射源4的辐射。样品3的表面温度由黑体辐射检测器如高温计6直接记录,该高温计被转换为高温。样品3在旋转期间周期性通过的空间的固定区域。表面温度是根据评估电路中检测到的黑体辐射计算得出的,并存储了不同样品3的发射率。;版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005091366A

    专利类型

  • 公开/公告日2005-04-07

    原文格式PDF

  • 申请/专利权人 ATLAS MATERIAL TESTING TECHNOLOGY GMBH;

    申请/专利号JP20040271237

  • 发明设计人 SCHOENLEIN ARTUR;

    申请日2004-09-17

  • 分类号G01N17/00;G01J5/02;G01J5/10;

  • 国家 JP

  • 入库时间 2022-08-21 22:29:02

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