To use a plug card with the JTAG logic, JTAG test bus

摘要

(57) [summary] Insert JTAG test card and a (200), JTAG boundary scan that may be used to send the JTAG test data bus unit to be connected to (160,180,190) peripheral slot (170,195) I equipped with a (230) circuit. It is possible to check the integrity of the connection between the point bus using JTAG test insert one or more cards (200), ending with a peripheral slot of the insert (170,195) on. In the embodiment One nice plug JTAG test card (200), simulate dual inline memory module single in-line memory modules or (DIMM) and (SIMM), these modules, scan testing buffer including (230) circuit, but does not include a memory chip in fact, it can be used a (200) insert the card inexpensive, is performed at the manufacturing stage the JTAG test (600) the mother plate of the multiple. In an embodiment of one particularly preferred, for example, is used as the test circuit rather than as the original interface circuit, JTAG boundary scan buffer circuit such as a SN74ABT8245 (230).