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Beam current measuring device and apparatus using the same

机译:束流测量装置及使用该束流测量装置的装置

摘要

A beam current measuring device (BMD) capable of measuring beam current while radiating the beam on a target, such as a semiconductor wafer. The BMD at least includes: (a) a detecting section for detecting or collecting a magnetic field corresponding to the beam current; and (b) measuring section including (i) a SQUID sensitive to magnetic flux, and (ii) a feedback coil for carrying feedback current to cancel out a change in the magnetic flux penetrating through the SQUID. With finite beam current except zero penetrating through the detecting section, the SQUID is locked. A BMD of the present invention can be incorporated and used in an ion-implantation apparatus, electron beam exposure apparatus, accelerator, and the like.
机译:束电流测量装置(BMD),能够在将束辐射到诸如半导体晶片的目标上时测量束电流。 BMD至少包括:(a)检测部分,用于检测或收集与束电流相对应的磁场; (b)测量部分,该测量部分包括(i)对磁通量敏感的SQUID,以及(ii)反馈线圈,用于承载反馈电流以抵消穿过SQUID的磁通量的变化。当有限的束流(零除外)穿过检测部分时,SQUID被锁定。本发明的BMD可以并入离子注入装置,电子束曝光装置,加速器等中并使用。

著录项

  • 公开/公告号US2005110484A1

    专利类型

  • 公开/公告日2005-05-26

    原文格式PDF

  • 申请/专利权人 YUICHIRO SASAKI;

    申请/专利号US20040023495

  • 发明设计人 YUICHIRO SASAKI;

    申请日2004-12-29

  • 分类号G01R31/00;G01R33/02;

  • 国家 US

  • 入库时间 2022-08-21 22:25:02

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