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Methods and structures for testing optical subassemblies at higher and lower temperatures

机译:在更高和更低的温度下测试光学组件的方法和结构

摘要

An assembly and method for testing an optical subassembly by locally heating or cooling the optical subassembly. Locally heating or cooling the optical subassembly can include using a thermal transfer assembly. The thermal transfer assembly can include a thermoelectric cooler. A clamping assembly is provided to place the optical subassembly in electrical communication with a testing assembly. The thermal transfer assembly can be associated with the clamping assembly. After achieving the desired temperature, a data stream is transmitted through the optical subassembly and evaluated for compliance.
机译:通过局部加热或冷却光学子组件来测试光学子组件的组件和方法。局部加热或冷却光学子组件可包括使用热传递组件。传热组件可以包括热电冷却器。提供了夹紧组件,以使光学子组件与测试组件电连通。热传递组件可以与夹紧组件相关联。在达到所需温度后,数据流将通过光学子组件传输并进行顺应性评估。

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