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Methods and structures for testing optical subassemblies at higher and lower temperatures
Methods and structures for testing optical subassemblies at higher and lower temperatures
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机译:在更高和更低的温度下测试光学组件的方法和结构
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摘要
An assembly and method for testing an optical subassembly by locally heating or cooling the optical subassembly. Locally heating or cooling the optical subassembly can include using a thermal transfer assembly. The thermal transfer assembly can include a thermoelectric cooler. A clamping assembly is provided to place the optical subassembly in electrical communication with a testing assembly. The thermal transfer assembly can be associated with the clamping assembly. After achieving the desired temperature, a data stream is transmitted through the optical subassembly and evaluated for compliance.
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