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Apparatus for the automated testing, calibration and characterization of test adapters
Apparatus for the automated testing, calibration and characterization of test adapters
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机译:用于自动测试,校准和表征测试适配器的设备
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摘要
The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least one probe head is provided which can be adjusted radially with respect to the holder. The probe head has two or more contact pins whose spacing distance is adjustable.
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