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Interferometric system for automated radius of curvature measurements

机译:用于自动曲率半径测量的干涉仪系统

摘要

An interferometric system for measuring the radius of curvature of a measurement object that includes a tunable coherent radiation source capable of emitting a radiant energy beam having a characteristic wavelength and of scanning the characteristic wavelength over a range of wavelengths; an unequal path interferometer which during operation includes a reference object and the measurement object and which receives a portion of the radiant energy beam from the tunable radiant energy source and generates an optical interference pattern; a detecting system including a detector for receiving the optical interference pattern; and a system controller connected to the tunable radiant energy source and the detecting system. The controller is programmed to cause the tunable radiant energy source to scan the characteristic wavelength over the range of wavelengths while concurrently monitoring the optical interference pattern via the detecting system and further programmed to calculate the radius of curvature of a surface of the measurement object from the monitored optical interference pattern.
机译:一种用于测量测量对象的曲率半径的干涉系统,其包括可调谐相干辐射源,该可调谐相干辐射源能够发射具有特征波长的辐射能束并且能够在波长范围内扫描该特征波长。一种不等径干涉仪,其在工作期间包括参考物体和测量物体,并从可调辐射能量源接收一部分辐射能束并产生光学干涉图样;一种检测系统,其包括用于接收光学干涉图案的检测器;系统控制器,连接至可调辐射能源和检测系统。控制器被编程为使得可调谐辐射能量源在波长范围内扫描特征波长,同时经由检测系统同时监视光学干涉图案,并且还被编程为根据可控辐射源计算测量对象表面的曲率半径。监视的光学干涉图样。

著录项

  • 公开/公告号US6894788B2

    专利类型

  • 公开/公告日2005-05-17

    原文格式PDF

  • 申请/专利权人 LESLIE L. DECK;

    申请/专利号US20010988891

  • 发明设计人 LESLIE L. DECK;

    申请日2001-11-19

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-21 22:21:44

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