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Method and apparatus for determining a sampling plan based on process and equipment state information

机译:基于过程和设备状态信息确定采样计划的方法和装置

摘要

A processing line includes a process tool, a metrology tool, a tool state monitor, and a sampling controller. The processing tool is configured to process workpieces. The metrology tool is configured to measure an output characteristic of selected workpieces in accordance with a sampling plan. The tool state monitor is configured to observe at least one tool state variable value during the processing of a selected workpiece in the processing tool. The sampling controller is configured to receive the observed tool state variable value and determine the sampling plan for the metrology tool based on the observed tool state variable value. A method for processing workpieces includes processing a plurality of workpieces in a processing tool. A characteristic of selected workpieces is measured in accordance with a sampling plan. At least one tool state variable value is observed during the processing of a particular workpiece in the processing tool. The sampling plan is determined based on the observed tool state variable value.
机译:处理线包括处理工具,计量工具,工具状态监视器和采样控制器。加工工具被配置为加工工件。计量工具被配置为根据采样计划来测量所选工件的输出特性。工具状态监控器被配置为在处理工具中处理选定的工件期间观察至少一个工具状态变量值。采样控制器被配置为接收观察到的工具状态变量值并基于观察到的工具状态变量值来确定用于计量工具的采样计划。一种用于处理工件的方法,包括在处理工具中处理多个工件。根据采样计划测量所选工件的特性。在加工工具中的特定工件的加工期间观察到至少一个工具状态变量值。根据观察到的工具状态变量值确定采样计划。

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