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Scan design for double-edge-triggered flip-flops
Scan design for double-edge-triggered flip-flops
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机译:扫描设计,用于双沿触发的触发器
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摘要
A double-edge-triggered flip-flop scan cell. The double-edge-triggered flip-flop scan cell provides the capability to capture and output data for each edge of a clock signal in a functional mode of a host integrated circuit. In a test mode, the double-edge triggered flip-flop scan cell enables test data to be scanned into and out of the scan cell to provide observability and controllability of the scan cell internal state.
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