首页> 外国专利> Method for slice position planning of tomographic measurements, using statistical images

Method for slice position planning of tomographic measurements, using statistical images

机译:利用统计图像进行断层摄影测量的切片位置计划的方法

摘要

In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.
机译:在用于操作断层成像设备的方法和计算机程序产品中,通过显示标准对象的计划表示,在计划表示中定义标准成像区域的空间位置并将其存储为标准来生成标准测量协议。标准对象的测量协议,对标准对象的引用以及标准成像区域的参数。然后,通过获取表示对应于标准对象的检查对象特征的数据,确定检查对象特征与对象特征之间的几何关系,可以将这种标准测量协议用于切片位置规划中以进行实际的断层摄影测量标准对象,并生成特定于对象的测量协议,其中通过修改标准测量协议,将成像区域相对于检查对象定位。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号