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Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement

机译:用于测量和校正自动测试装置的正确性的方法和设备

摘要

A method of and an apparatus for determining the correctness of the calibration of an automatic test arrangement and correcting errors in the automatic test arrangement. The electrical length is determined from the tester driver of the automatic test arrangement to the socket pin of the tester interface unit, from the tester driver to a grounding point of the device under test, from the tester driver to the tester interface unit, and with the tester interface unit output pin connected to ground by a shorting block from the tester driver through the shorting block ground. The difference between the first electrical length and the second electrical length is compared with the difference between the first electrical length and the third electrical length, and the result is evaluated to determine the correctness of the calibration of the automatic test arrangement.
机译:用于确定自动测试装置的校准的正确性并校正自动测试装置中的误差的方法和装置。电气长度从自动测试装置的测试仪驱动器到测试仪接口单元的插座引脚,从测试仪驱动器到被测设备的接地点,从测试仪驱动器到测试仪接口单元,以及测试仪接口单元的输出引脚通过测试块驱动器的短路块通过短路块接地而接地。将第一电气长度和第二电气长度之间的差与第一电气长度和第三电气长度之间的差进行比较,并且评估结果以确定自动测试装置的校准的正确性。

著录项

  • 公开/公告号US6829553B2

    专利类型

  • 公开/公告日2004-12-07

    原文格式PDF

  • 申请/专利权人 INTEL CORPORATION;

    申请/专利号US20010821115

  • 发明设计人 GREG P. CHEMA;SUNIL K. JAIN;

    申请日2001-03-30

  • 分类号G01R312/80;

  • 国家 US

  • 入库时间 2022-08-21 22:18:55

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